WCT-120 少子壽命測(cè)試儀
| 參考價(jià) | ￥ 10 |
| 訂貨量 | ≥1 |
- 公司名稱 上海瞬渺光電科技有限公司
- 品牌
- 型號(hào) WCT-120
- 產(chǎn)地 美國(guó)
- 廠商性質(zhì) 經(jīng)銷商
- 更新時(shí)間 2017/7/19 18:15:02
- 訪問(wèn)次數(shù) 1862
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WCT testers showcase our unique measurement and analysis techniques, including the highly regarded Quasi-Steady-State Photoconductance （QSSPC） lifetime measurement method developed by Sinton Instruments in 1994.
The QSSPC technique is ideal for monitoring multicrystalline wafers, dopant diffusions, and low-lifetime samples. This method complements the use of the transient photoconductance technique that is also standard on this instrument.
The QSSPC lifetime measurement also yields the implied open-circuit voltage （versus illumination） curve, which is comparable to an I-V curve at each stage of a solar cell process.
WCT System Capabilities
Primary application:
Step-by-step monitoring and optimization of a fabrication process.
Other applications:
Sinton Instruments' analysis yields a calibrated carrier injection level for each wafer, so you can interpret lifetime data in a physically precise way. Specific parameters of interest are displayed and logged for each measurement.
• Monitoring initial material quality
• Detecting heavy metals contamination during wafer processing
• Evaluating surface passivation and emitter dopant diffusion
• Evaluating process-induced shunting using the implied I-V measurement
Further Information
技術(shù)參數(shù)：
FAQ:
• What is the recombination lifetime?
• How does the solar cell efficiency depend on the lifetime?
• What determines the lifetime in silicon?
• How is lifetime measured by the Sinton Instruments tools?
• How is the data analyzed?
• Can you measure surface recombination velocity?
• Does the system measure emitter saturation current density?
• Can wafers be measured with no surface passivation （“out of the box”）?
• Can any of these instruments do lifetime maps?
• How do these measurements compare to microwave PCD?
• What lifetimes can be measured?
• What is the smallest sample size?
• How do you measure bulk lifetime on blocks or ingots?
• At what carrier density should I report the result?
• Can the lifetime tester be used to detect Fe contamination?
• How is the instrument calibrated?
• When should wafers be tested inline?
• Does the lifetime tester measure the trapping?
Module and Cell Flash Testers frequently asked questions
主要特點(diǎn)：
常見(jiàn)問(wèn)題：
WT-2000與WCT-120測(cè)少子壽命的差異？
WCT用的是Quasi-Steady-State Photoconductance（QSSPC準(zhǔn)穩(wěn)態(tài)光電導(dǎo)）而WT2000是微波光電導(dǎo)。
WCT-120/100準(zhǔn)穩(wěn)態(tài)光電導(dǎo)法測(cè)少子壽命的原理？
WCT用的是Quasi-Steady-State Photoconductance（QSSPC準(zhǔn)穩(wěn)態(tài)光電導(dǎo)）
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